Wednesday, March 17, 2010

Thickness response of the Berreman effect

A team of researcher including JMU faculty has unveiled the response of the berreman effect to the thickness of oxide layers. The results are published in:
G. Scarel, J.-S. Na, B. Gong, and G.N. Parsons, “Phonon response in the infrared region to thickness of oxide films formed by atomic layer deposition”. Appl. Spectrosc. vol. 64, p. 120-126 (2010).