Wednesday, February 01, 2012
New publication in Applied Spectroscopy
Did you know that the ability of thin oxide films to absorb infrared radiation depends on whether they "sit" on a metal, or on a piece of semiconductor, or on an insulator? Undergraduate student Anita Vincent-Johnson discovered that this is the case by creating computer simulations of the response of the thin films to the infrared radiation. The effort was accomplished under the direction of Dr. Giovanna Scarel and the results were discussed with collaborators of the University of Utah and of Howard University. The team discovered a peculiar substrate sensitive thickness where the effect is particularly evident, as illustrated in the picture on the left. The full reference is A. J. Vincent-Johnson et al., "Effects of metallic, semiconducting, and insulating substrates in the coupling involving radiative polaritons in thin oxide films", Applied Spectroscopy vol. 66 (2), pages 188-197 (2012).